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KMID : 0364920090340010025
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Journal of Radiation Protection and Research
2009 Volume.34 No. 1 p.25 ~ p.30
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THE EFFECT OF SURFACE ROUGHNESS OF CSI(TL) MICRO-COLUMNS ON THE RESOLUTION OF THE X-RAY IMAGE; OPTICAL SIMULATION STUDY
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Kim Hyun-Ki
Bae Jun-Hyung
Cha Bo-Kyung
Jeon Ho-Sang
Kim Jong-Yul
Kim Chan-Kyu
Cho Gyu-Seong
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Abstract
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Micro-columnar CsI(Tl) is the most popular scintillator material which is used for many indirect digital X-ray imaging detectors. The light scattering at the surface of micro-columnar CsI(Tl) scintillator was studied to find the correlation between the surface roughness and the resultant image resolution of indirect X-ray imaging detectors. Using a commercially available optical simulation program, Light Tools, MTF (Modulation Transfer Function) curves of the CsI(Tl) film thermally evaporated on glass substrate with different thickness were calculated and compared with the experimental estimation of MTF values by the edge X-ray image method and CCD camera. It was found that the standard deviation value of Gaussian scattering model which is determined by the surface roughness of micro-columns could certainly change the MTF value of image sensors. This model and calculation methodology will be beneficial to estimate the overall performance of indirect X-ray imaging system with CsI(Tl) scintillator film for optimum design depending on its application.
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KEYWORD
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Micro-columnar, CsI(Tl), Scintillator, X-ray Detector, Surface Roughness, Simulation
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